The HAL 2810 is a member of the Micronas family HAL 28xy of programmable linear Hall-effect sensors.

It features a Hall-plate with spinning current offset compensation technique and a precise temperature sensor which is used for temperature compensation of both the Hall-sensors sensitivity and offset.

The sensor provides a digital signal processing. This is of great benefit because analog offsets, temperature shifts, and mechanical stress do not degrade digital signals.

The HAL 2810 is designed as a LIN slave according to the LIN Specification Package Rev. 2.0. All communications (programming, diagnostics, and measurement signal transport) is realized by means of LIN frames.

Major characteristics like magnetic field range, sensitivity, offset and the temperature coefficients of sensitivity and offset can easily be adjusted to the magnetic circuit by programming the non-volatile memory.

The HAL 2810 is available in the very small leaded package TO-92UT.

System Architecture

The HAL 2810 sensors are produced in a proven automotive submicron CMOS technology.

The HAL 2810 features a temperature-compensated Hall plate with spinning-current offset compensation, an A/D converter for the Hall-plate, an A/D converter for the temperature sensor, digital signal processing, a fully integrated LIN interface including the physical layer, an EEPROM memory with redundancy and lock function for the calibration data and the LIN configuration, and protection devices on all pins.

The HAL 2810 is programmable by means of LIN frames. No additional programming pin is needed.

Block diagram of the HAL 2810

Main Features

Major Applications

Development Tools

As all communication is done by means of LIN frames, any available LIN tool chain can be used for configuration and programming of the HAL 28xy. For engineering purposes, Micronas offers an easy-to-use application kit:

Development tool setup